发明名称 Semiconductor device and manufacturing method thereof
摘要 A method for producing a thin-film transistor by using a crystalline silicon film that has been formed by using nickel as a metal element for accelerating crystallization of silicon. In forming source and drain regions, phosphorus as an element for gettering nickel is introduced therein by ion implantation. Nickel gettering is effected by annealing. For example, in the case of producing a P-channel thin-film transistor, both phosphorus and boron are used. Boron determines a conductivity type, and phosphorus is used as a gettering material.
申请公布号 US2003134459(A1) 申请公布日期 2003.07.17
申请号 US20030353158 申请日期 2003.01.27
申请人 SEMICONDUCTOR ENERGY LABORATORY CO. LTD., A JAPAN CORPORATION 发明人 TANAKA KOICHIRO;OHNUMA HIDETO
分类号 H01L21/336;H01L27/12;H01L29/786;(IPC1-7):H01L21/00 主分类号 H01L21/336
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