发明名称 METHODS FOR SILICON OXIDE AND OXYNITRIDE DEPOSITION USING SINGLE WAFER LOW PRESSURE CVD
摘要 An oxide and an oxynitride films and their methods of fabrication are described.The oxide or the oxynitride film is grown on a substrate that is placed in a deposition chamber.A silicon source gas(or a silicon source gas with a nitridation source gas)and an oxidation source gas are decomposed in the deposition chamber using a thermal energy source.A silicon oxide(or an oxynitride)film is formed above the substrate wherein total pressure for the deposition chamber is maintained in the range of 50 Torr to 350 Torr and wherein a flow ratio for the silicon source gas(or the silicon source gas with the nitridiation source gas)and the oxidation source gas is in the range of 1:50 to 1:10000 during a deposition process.
申请公布号 WO03057942(A1) 申请公布日期 2003.07.17
申请号 WO2002US40867 申请日期 2002.12.19
申请人 APPLIED MATERIALS, INC.;SUBRAMONY, JANARDHANAN, ANAND;YOKOTA, YOSHITAKA;IYER, RAMASESHAN, SURYANARAYANAN;LUO, LEE;CHEN, AIHUA 发明人 SUBRAMONY, JANARDHANAN, ANAND;YOKOTA, YOSHITAKA;IYER, RAMASESHAN, SURYANARAYANAN;LUO, LEE;CHEN, AIHUA
分类号 C23C16/42;C23C16/30;C23C16/40;C23C16/44;C23C16/455;C23C16/56;H01L21/316;H01L21/318;(IPC1-7):C23C16/40 主分类号 C23C16/42
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