发明名称 Method for depositing metal film through chemical vapor deposition process
摘要 The present invention provides a method for depositing a metal film capable of suppressing oxygen from remaining within the metal film and preventing clustering of the metal film due to a low temperature deposition by employing a chemical vapor deposition process and a method for depositing a Ru film using the CVD process. The present invention provides a method for depositing a metal film by using a chemical vapor deposition process, including the steps of: loading a substrate to a reactor where a metal film will be deposited; heating the substrate to densify the metal film as simultaneous to a deposition of the metal film; and depositing the metal film on the substrate by adding a precursor of the metal film and a reaction gas having a reducing ability to the heated substrate.
申请公布号 US2003134511(A1) 申请公布日期 2003.07.17
申请号 US20020321729 申请日期 2002.12.18
申请人 KIM YOUNSOO 发明人 KIM YOUNSOO
分类号 C23C16/18;H01L21/02;(IPC1-7):H01L21/44 主分类号 C23C16/18
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