发明名称 SYSTEM AND METHODS FOR ANALYZING COPPER CHEMISTRY
摘要 The present invention relates to methods for removing the matrix effects caused by variance in copper concentration and acidity during measurement of the organic additive concentration in a sample copper plating solution.
申请公布号 WO03057947(A1) 申请公布日期 2003.07.17
申请号 WO2002US40450 申请日期 2002.12.19
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 KING, MACKENZIE, E.;BELLA, RICHARD;SCHOMBURG, CORY;ROBERTSON, PETER
分类号 G01N21/35;G01N27/416;G01N27/42;(IPC1-7):C25D21/12 主分类号 G01N21/35
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