| 摘要 |
When a test mode signal from a control circuit is activated, an operation of a column related circuit is controlled to continuously apply a voltage stress to complementary internal data lines included in the column related circuit. Specifically, a write driver driving a data line is forcedly kept in an inactive state, a sense amplifier is connected to the internal data lines, a column select operation is prohibited and the internal data lines are forcedly, continuously driven in accordance with the write driver, or a voltage setting circuit is connected to the internal data lines and the voltage stress of the internal data lines is accelerated in accordance with the voltage setting circuit during a test. It is possible to continuously apply the voltage stress between complementary data lines of the internal data lines without the need to repeatedly carry out a data write operation, and it is possible to reduce time required for an inter-complementary data line voltage stress test.
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