发明名称 Method and apparatus for testing a process in a computer system
摘要 A method and apparatus for testing processes in a computer system are described. In a software process, there exist many test points in the execution of the process where stress testing may be applied. The process is executed with stress testing applied at selected test points and test intervals. The selected test points are based on prime numbers and varied for successive execution iterations. An efficient distribution of evaluated test points is achieved, and all possible test points are ultimately evaluated within a small number of execution iterations. In one embodiment, the total number of test points is first determined. A first execution run is evaluated at selected test points that correspond to prime numbers greater than the square root of the total number of test points. Subsequent execution iterations are then performed evaluating test points at selected test intervals, where the test intervals for respective execution iterations correspond to prime numbers less than or equal to the square root of the total number of test points. The prime numbers for the selected test intervals are chosen in decreasing order, for example.
申请公布号 US6594820(B1) 申请公布日期 2003.07.15
申请号 US19990406502 申请日期 1999.09.28
申请人 SUN MICROSYSTEMS, INC. 发明人 UNGAR DAVID
分类号 G06F11/36;(IPC1-7):G06F9/44;H02H3/05 主分类号 G06F11/36
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