发明名称 Method of controlling a shape of an oxide layer formed on a substrate
摘要 A method of forming an oxide layer on a substrate comprises deposition of a mask layer with an opening for defining the area where the oxide layer is to be formed, and an ion implantation step performed with a tilt angle so as to obtain a varying ion concentration. In a subsequent single oxidation step, an oxide layer is formed having a thickness that varies in conformity with the ion concentration. This method may advantageously be applied to the formation of a gate insulation layer in a field effect transistor.
申请公布号 US6593175(B2) 申请公布日期 2003.07.15
申请号 US20010809710 申请日期 2001.03.14
申请人 ADVANCED MICRO DEVICES, INC. 发明人 FEUDEL THOMAS;HORSTMANN MANFRED;KRUEGER CHRISTIAN
分类号 H01L21/265;H01L21/28;H01L21/316;H01L21/32;H01L27/12;H01L29/423;(IPC1-7):H01L21/00;H01L21/84 主分类号 H01L21/265
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