发明名称 |
Method of controlling a shape of an oxide layer formed on a substrate |
摘要 |
A method of forming an oxide layer on a substrate comprises deposition of a mask layer with an opening for defining the area where the oxide layer is to be formed, and an ion implantation step performed with a tilt angle so as to obtain a varying ion concentration. In a subsequent single oxidation step, an oxide layer is formed having a thickness that varies in conformity with the ion concentration. This method may advantageously be applied to the formation of a gate insulation layer in a field effect transistor.
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申请公布号 |
US6593175(B2) |
申请公布日期 |
2003.07.15 |
申请号 |
US20010809710 |
申请日期 |
2001.03.14 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
FEUDEL THOMAS;HORSTMANN MANFRED;KRUEGER CHRISTIAN |
分类号 |
H01L21/265;H01L21/28;H01L21/316;H01L21/32;H01L27/12;H01L29/423;(IPC1-7):H01L21/00;H01L21/84 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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