发明名称 Chemical mechanical polishing method useful for copper substrates
摘要 A chemical mechanical polishing slurry comprising a film forming agent, an oxidizer, a complexing agent and an abrasive, and a method for using the chemical mechanical polishing slurry to remove copper alloy, titanium, and titanium nitride containing layers from a substrate.
申请公布号 US6593239(B2) 申请公布日期 2003.07.15
申请号 US19990366588 申请日期 1999.08.04
申请人 CABOT MICROELECTRONICS CORP. 发明人 KAUFMAN VLASTA BRUSIC;KISTLER RODNEY C.
分类号 C09G1/02;C23F3/06;H01L21/321;(IPC1-7):H01L21/302 主分类号 C09G1/02
代理机构 代理人
主权项
地址