发明名称 A device with thin spacers to improve salicide resistance on polysilicon gates
摘要 The several embodiments of the invention provide for formation of gate electrode structures with recessed and partially recessed spacers. One embodiment, provides a gate electrode structure with recessed thick inner spacers and thick outer spacers. Another embodiment provides a gate electrode structure with recessed thin inner spacers and recessed thick outer spacers. Another embodiment provides a gate electrode structure with thin inner spacers and partially recessed outer spacers. Another embodiment provides a gate electrode structure with two spacer stacks. The outermost spacer stack with recessed thin inner spacers and recessed thick outer spacers. The inner spacer stack with thin inner spacers and thin outer spacers. Another embodiment provides a gate electrode structure with two spacer stacks. The outermost spacer stack with recessed thin inner spacers and recessed thick outer spacers. The inner spacer stack with recessed thin inner spacers and recessed thin outer spacers.
申请公布号 US6593633(B2) 申请公布日期 2003.07.15
申请号 US20000477869 申请日期 2000.01.05
申请人 INTEL CORPORATION 发明人 JAN CHIA-HONG;TSAI JULIE A.;YANG SIMON;GHANI TAHIR;WHITEHILL KEVIN A.;KEATING STEVEN J.;MYERS ALAN
分类号 H01L21/28;H01L21/336;H01L21/8234;H01L29/49;(IPC1-7):H01L29/76 主分类号 H01L21/28
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