发明名称 S-parameter measurement system for wideband non-linear networks
摘要 A system for determining scattering parameters (S-parameters) characterizing the behavior of a network applies a wideband stimulus signal containing multiple signal components as input to the network. The system then measures incident and reflected waveforms at all of the network's ports, digitizes and converts the measured waveforms from time domain to frequency domain data, and then computes the S-parameters values for each frequency component of interest from the frequency domain data for that frequency. The system also determines its own error coefficients (E-coefficients) for each frequency of interest from data collected during a sequence of measurements in response to either a sinusoid or a wideband signal and adjusts the computed S-parameter values accordingly.
申请公布号 US6594604(B2) 申请公布日期 2003.07.15
申请号 US20010783912 申请日期 2001.02.14
申请人 CREDENCE SYSTEMS CORPORATION 发明人 METZGER DONALD M.;MARSHALL DAVID B.;HAINDS CURTIS C.
分类号 G01R27/28;G01R31/28;G01R35/00;(IPC1-7):G01C19/00 主分类号 G01R27/28
代理机构 代理人
主权项
地址