| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an apparatus for inspecting the trademark position of an integrated circuit. <P>SOLUTION: The apparatus comprises an inspection plate 20 and a substrate 30. The inspection plate 20 formed of a transparent anti-static electricity acrylic plate has a plurality of inspection scales 21 formed on its top, and a plurality of fixed position holes 22 formed at prescribed positions. The substrate A has a plurality of fixed position pins 31, which correspond to the plurality of fixed position holes 22, formed thereon. A nail frame 40 is assembled between the substrate 30 and the inspection plate 20, and a trademark on the surface of the corresponding integrated circuit 42 can be inspected with the scales 21. The installing positions and systems of the scales 21 are decided by the form of the trademark on the surface of the integrated circuit 42, and the scales corresponding to the trademark positions of the integrated circuit 42 can be used. At the bottom of the fixed position holes 22, a metallic bushing is provided for easily inserting the position pins 31 of the substrate 30. <P>COPYRIGHT: (C)2003,JPO |
