| 摘要 |
PROBLEM TO BE SOLVED: To enable verification of the operation state of each pixel in a pixel array part and to simplify a device test to shorten the test time. SOLUTION: A test logic part 14 is provided, which converts an electric signal which is an analog signal generated by a pixel array part 12 provided with a plurality of pixels for photoelectric conversion, to a digital signal by an A/D converter 13 and uses the A/D converted digital signal to verify whether the operation state of each pixel in the pixel array part 12 is normal or not. COPYRIGHT: (C)2003,JPO |
