| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of testing a mask formed-substrate which is capable of sorting out substrates whose positional deviation is within an allowable range and which are formed with a conformal mask usable for laser processing, before laser processing in a method of manufacturing a multilayer circuit board. SOLUTION: In a manufacturing process of a multilayer circuit board 9 wherein after a conformal mask 7 is formed to fabricate a mask-formed substrate 8, holes are formed by laser processing, part of a metal outer layer 4 at a place facing a laid land 11 formed on an inner layer circuit formation face 2 is removed to form a vacant land 12 in advance. By using a test coupon 13 which consists of the laid land 11 and the vacant land 12, mask-formed substrates 8 properly formed with the conformal mask 7 can be sorted out from those not properly formed with the conformal mask 7. COPYRIGHT: (C)2003,JPO |
