发明名称 |
Memory cell with trench transistor has pn junctions defining channel region abutting walls of trench within curved area at base of trench |
摘要 |
The memory cell has a gate electrode (4) contained in trench between a source region (2) and a drain region (3), with separation of the gate electrode from the semiconductor material by a dielectric layer acting as a memory medium. The pn junctions (14) defining the channel region (5) abut the walls of the trench within a curved lower area at the base (7) of the trench.
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申请公布号 |
DE10162261(A1) |
申请公布日期 |
2003.07.10 |
申请号 |
DE20011062261 |
申请日期 |
2001.12.18 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
WILLER, JOSEF;LAU, FRANK;TAKACS, DEZSOE |
分类号 |
H01L27/115;H01L29/423;H01L29/792;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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