发明名称 Memory cell with trench transistor has pn junctions defining channel region abutting walls of trench within curved area at base of trench
摘要 The memory cell has a gate electrode (4) contained in trench between a source region (2) and a drain region (3), with separation of the gate electrode from the semiconductor material by a dielectric layer acting as a memory medium. The pn junctions (14) defining the channel region (5) abut the walls of the trench within a curved lower area at the base (7) of the trench.
申请公布号 DE10162261(A1) 申请公布日期 2003.07.10
申请号 DE20011062261 申请日期 2001.12.18
申请人 INFINEON TECHNOLOGIES AG 发明人 WILLER, JOSEF;LAU, FRANK;TAKACS, DEZSOE
分类号 H01L27/115;H01L29/423;H01L29/792;(IPC1-7):H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项
地址