发明名称 Exposure method, exposure apparatus, method for adjusting the exposure apparatus, and device manufacturing method
摘要 Attention is paid to the phenomenon that a static image distortion characteristic is averaged in the width of a projection area in a scanning direction and becomes a dynamic image distortion characteristic, when a mask pattern is scan-exposed onto a photosensitized substrate by a projection exposure apparatus. At least a random component included in the dynamic image distortion characteristic is corrected by arranging an image correction plate obtained by locally polishing the surface of a transparent parallel plate. Correction plates which minimize other aberrations beforehand are manufactured and installed within a projection optical path, considering that also the other aberrations are averaged and become dynamic aberration characteristics at the time of scan-exposure.
申请公布号 US2003128344(A1) 申请公布日期 2003.07.10
申请号 US20020321597 申请日期 2002.12.18
申请人 NIKON CORPORATION 发明人 NISHI KENJI
分类号 G03F7/20;(IPC1-7):G03B27/68 主分类号 G03F7/20
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