PROBE FOR AN ATOMIC FORCE MICROSCOPE AND METHOD FOR MAKING SUCH A PROBE

摘要

The invention relates to a probe for a magnetic force microscope,comprising a movable cantilever placed in the plane of a wafer and a tip placed substantially at right angles to the cantilever,wherein the cantilever is able to move and its oscillation direction is in the wafer plane,and the tip lies virtually in or parallel to this wafer plane.