SYSTEM AND METHOD OF OPTICALLY TESTING MULTIPLE EDGE-EMITTING SEMICONDUCTOR LASERS RESIDING ON A COMMON WAFER

摘要

A system and method of testing multiple edge-emitting lasers (300) on a common wafer (380) is provided. This is accomplished by providing, for each edge-emitting laser (300) on a common fabrication wafer (380), a structure (340) that re-directs a portion of the edge-emitting laser in a direction such that the re-directed portion from each edge-emitting laser can be measured while the edge-emiting lasers (300) are still on the fabrication wafer (380). Each edge-emitting laser (300) on the fabrication wafer (380) can therefore be easily tested before cleaving or breaking the wafer (380) into multiple pieces.