发明名称 METHOD FOR FORMING FUSE BOX OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a fuse box of a semiconductor device is provided to be capable of improving the uniformity of an insulating layer located on a fuse irrespective of the position of a wafer. CONSTITUTION: The first insulating layer is formed on a substrate(100) having a fuse(101). After forming a barrier metal film(103) on the first insulating layer, the second insulating layer is formed on the resultant structure. The second insulating layer is selectively etched using the barrier metal film as an etch stop layer. After removing the exposed barrier metal film(103), the first insulating layer is partially etched to form a fuse box(110).
申请公布号 KR20030059446(A) 申请公布日期 2003.07.10
申请号 KR20010088308 申请日期 2001.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, GWI OK;KIM, JEONG SU
分类号 H01L27/02;(IPC1-7):H01L27/02 主分类号 H01L27/02
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