发明名称 |
METHOD FOR FORMING FUSE BOX OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a fuse box of a semiconductor device is provided to be capable of improving the uniformity of an insulating layer located on a fuse irrespective of the position of a wafer. CONSTITUTION: The first insulating layer is formed on a substrate(100) having a fuse(101). After forming a barrier metal film(103) on the first insulating layer, the second insulating layer is formed on the resultant structure. The second insulating layer is selectively etched using the barrier metal film as an etch stop layer. After removing the exposed barrier metal film(103), the first insulating layer is partially etched to form a fuse box(110).
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申请公布号 |
KR20030059446(A) |
申请公布日期 |
2003.07.10 |
申请号 |
KR20010088308 |
申请日期 |
2001.12.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, GWI OK;KIM, JEONG SU |
分类号 |
H01L27/02;(IPC1-7):H01L27/02 |
主分类号 |
H01L27/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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