发明名称 METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A method for manufacturing a capacitor of a semiconductor memory device is provided to be capable of preventing bridge between lower electrodes and improving capacitance. CONSTITUTION: An insulating layer(53) is formed on a substrate(50) having a plug(52). A contact hole is formed to expose the plug. A barrier layer(54) is formed at sides of the insulating layer. A lower electrode is formed and an MPS(Metastable PolySilicon) layer(56) is formed on the lower electrode. A buried layer is filled into the contact hole. After isolating the lower electrodes, the buried layer is removed by wet-etching. A dielectric film(58) and an upper electrode(59) are sequentially formed on the lower electrode.
申请公布号 KR20030059357(A) 申请公布日期 2003.07.10
申请号 KR20010088206 申请日期 2001.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, UNG
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
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