| 摘要 |
PROBLEM TO BE SOLVED: To create and edit a waveform template or mask for a testing measuring apparatus without using external apparatus. SOLUTION: A mask editor is called from an application operating on the measuring apparatus displaying a context (24). The context from the application is displayed as a reference, and the current mask unrelated to the context is displayed as part of the mask editor (26 and 28). The current mask for the reference is edited to define a new mask (32) and the mask editor is exited to return to the application (34, 36) and apply the new mask to the context within the application (38). COPYRIGHT: (C)2003,JPO
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