发明名称 SYSTEM AND PROCESS FOR PARTICULATE ANALYSIS
摘要 PROBLEM TO BE SOLVED: To provide a system for analyzing particles. SOLUTION: This system for analyzing particles includes a source of solid particles, a sampler apparatus 50 connected to and integral with the source of solid particles and adapted to remove a small quantity of sample material from the generation source, a sonication cell connected to the sampling apparatus 50, for receiving the small quantity of sample material, and performing optional conditioning and sonication, a sample analysis apparatus connected to the sonication cell and adapted to receive the sonicated sample from the sonication cell and to perform optional conditioning again and analysis, and a liquid pump and a liquid transport line adapted to draw aliquots from the source, to transport the sampled aliquot to the sonication cell and the sample analytical apparatus and to flush the system free of residual aliquot contamination. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003194685(A) 申请公布日期 2003.07.09
申请号 JP20020359317 申请日期 2002.12.11
申请人 XEROX CORP 发明人 MALACHOWSKI STEVEN M;MARCELLO VINCENZO G
分类号 G01N1/00;G01N1/28;G01N1/34;G01N1/36;G01N15/06;(IPC1-7):G01N1/28 主分类号 G01N1/00
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