| 摘要 |
PROBLEM TO BE SOLVED: To provide a chip part measuring system and a chip part measuring method capable of stably determining the characteristic of two or more chip parts mounted adjacent to each other with high accuracy. SOLUTION: This chip part measuring system 1 is composed of two or more chip part measuring devices 2, and each chip part 50a, 50b, 50c, 50d of a multiple chip part body 3 is held at its left and right sides by each chip part measuring device 2 to measure the characteristic. This chip part measuring device 2 comprises two or more probe 18a, 18b, 18c, 18d respectively measuring the characteristic of the corresponding chip part, driving means 30a, 30b driving each probe, and a control part (not shown in a drawing) controlling the driving means 30a, 30b. The control part controls the driving means so that the characteristic of the adjacent chip part is not measured by the corresponding probe during the measurement of the characteristic of a certain one chip part of the multiple chip part body 3 by the corresponding probe. COPYRIGHT: (C)2003,JPO
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