发明名称 |
Method of forming a semiconductor device and structure therefor |
摘要 |
A method of forming a semiconductor device (10, 40, 45, 50) forms a plurality of P and N stripes (16,17) within a first region (12) that is formed with an opposite conductivity to a substrate (11). The plurality of P and N stripes assist in providing a low on-resistance. A portion (15) of the first region underlies the P and N stripes and protects the semiconductor device from high voltages applied to the drain. A base layer (41) and a cap layer (48) further reduce the on-resistance of the semiconductor device.
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申请公布号 |
US6589845(B1) |
申请公布日期 |
2003.07.08 |
申请号 |
US20020195166 |
申请日期 |
2002.07.16 |
申请人 |
SEMICONDUCTOR COMPONENTS INDUSTRIES LLC |
发明人 |
NAIR RAJESH S.;HOSSAIN ZIA;ISHIGURO TAKESHI;IMAM MOHAMED |
分类号 |
H01L29/06;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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