发明名称 Field emission arrays and method of fabricating same to optimize the size of grid openings and to minimize the occurrence of electrical shorts
摘要 A method for fabricating a field emission structure is disclosed. A first dielectric layer and a second material layer are disposed over a substrate and at least one emitter tip thereon. Planarization of the second layer exposes regions of the first layer that cover the emitter tip, which regions may then be removed through the second layer. Substantially removal of the second layer reduces any conductive defects that protrude from a surface of the first layer. A third, dielectric layer and fourth, grid layer are then formed. Planarization of the fourth layer forms grid openings and exposes dielectric material of the third layer which overlies the emitter tip. Dielectric material of one or both underlying layers may then be removed to expose the outer surfaces of the emitter tip.
申请公布号 US6589803(B2) 申请公布日期 2003.07.08
申请号 US20020114492 申请日期 2002.04.02
申请人 MICRON TECHNOLOGY, INC. 发明人 DERRAA AMMAR
分类号 H01J9/02;(IPC1-7):H01L21/00 主分类号 H01J9/02
代理机构 代理人
主权项
地址