发明名称 Manufacturing method for top-gate type and bottom-gate type thin film transistors
摘要 A microcrystal silicon film is formed on a substrate by using a silicide gas, a hydrogen gas, and a source gas that enables introduction of a metal element for accelerating crystallization of silicon in a capacitance-coupling plasma CVD apparatus. The action of the metal element provides a high film forming rate. Therefore, a technique for forming a microcrystal silicon film with high quality and high film forming rate can be provided.
申请公布号 US6589822(B1) 申请公布日期 2003.07.08
申请号 US19990407165 申请日期 1999.09.28
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;ARAI YASUYUKI
分类号 C30B29/06;C23C16/24;C23C16/511;H01L21/20;H01L21/205;H01L31/04;H01L31/18;(IPC1-7):H01L21/84 主分类号 C30B29/06
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