发明名称 |
Electrostatic discharge protection structure |
摘要 |
An electrostatic discharge (ESD) protection structure is disclosed. The ESD protection structure of the present invention uses a resistance capacitance (RC) circuit to distinguish an overshoot phenomenon caused by the instantaneous power-on from an ESD event, so as to prevent the ESD protection device, such as a P-type modified lateral silicon controlled rectifier (MLSCR), from being triggered unexpectedly by an overshoot phenomenon which results from the power-on under normal operation, and thereby the efficiency of the ESD protection device is promoted.
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申请公布号 |
US6590261(B2) |
申请公布日期 |
2003.07.08 |
申请号 |
US20010973927 |
申请日期 |
2001.10.10 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
SU SHIN;LAI CHUN-HSIANG;LIU MENG-HUANG;LU TAO-CHENG |
分类号 |
H01L23/60;H01L23/62;H01L29/00;H01L29/74;(IPC1-7):H01L23/62 |
主分类号 |
H01L23/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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