发明名称 Electrostatic discharge protection structure
摘要 An electrostatic discharge (ESD) protection structure is disclosed. The ESD protection structure of the present invention uses a resistance capacitance (RC) circuit to distinguish an overshoot phenomenon caused by the instantaneous power-on from an ESD event, so as to prevent the ESD protection device, such as a P-type modified lateral silicon controlled rectifier (MLSCR), from being triggered unexpectedly by an overshoot phenomenon which results from the power-on under normal operation, and thereby the efficiency of the ESD protection device is promoted.
申请公布号 US6590261(B2) 申请公布日期 2003.07.08
申请号 US20010973927 申请日期 2001.10.10
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 SU SHIN;LAI CHUN-HSIANG;LIU MENG-HUANG;LU TAO-CHENG
分类号 H01L23/60;H01L23/62;H01L29/00;H01L29/74;(IPC1-7):H01L23/62 主分类号 H01L23/60
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