发明名称 |
Apparatus for inspecting display board or circuit board |
摘要 |
An apparatus for inspecting a display board or a circuit board in which an inspection terminal 4 of an inspection probe block B is pressed into contact with an electrode pad 3 of a display board or a circuit portion P for inspection. A probe block supporting frame member 2 has an expandable and contractible structure, and when the probe block supporting frame member 2 is expanded, a board supporting frame member 1 can be relatively advanced. Due to the relative advancement of the board supporting frame member 1, the display board or the circuit board P protrudes forward of a distal end of the terminal 4 of the probe block B through an enlarged opening area 16 of the probe supporting frame member 2, so that the display board or the circuit board P supported on the board supporting frame member 1 can be exchanged with another board.
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申请公布号 |
US6590406(B2) |
申请公布日期 |
2003.07.08 |
申请号 |
US20010974895 |
申请日期 |
2001.10.12 |
申请人 |
SOSHOTECH CO., LTD;ADTEC ENGINEERING CO., LTD. |
发明人 |
OKUNO TOSHIO;MIZUTANI GUNJI;NAGASHIMA MASATOMO;FURUMI TADASHI |
分类号 |
G01R1/06;G01R31/02;G01R31/28;G09F9/00;G09G3/00;H05K3/00;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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