发明名称 Measuring parameters of DUT at specified frequency using vector network analyzer
摘要 A method for taking measurements using a vector network analyzer (VNA) enables a reduction in interference created when the VNA is operated in the presence of external signals. For the method, three measurements are taken, one at a desired measurement frequency, another at a frequency slightly less than the desired measurement frequency, and another at a slightly greater frequency than the desired measurement frequency. An interfering signal may occur at or near the frequency of one of the three measurements. To eliminate measurement error from the interfering signal, the measurement signal with the median, or middle, magnitude is selected to provide the measurement results.
申请公布号 US6590399(B1) 申请公布日期 2003.07.08
申请号 US20000560050 申请日期 2000.04.27
申请人 ANRITSU COMPANY 发明人 KARL ERIC BRANDEN;LAU YUENIE
分类号 H04B17/02;(IPC1-7):G01R27/28;G01R23/00;G01R13/00 主分类号 H04B17/02
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