发明名称 METHOD FOR FABRICATING ISOLATION LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating an isolation layer of a semiconductor device is provided to prevent a defect in a trench and prevent a characteristic of the semiconductor device from being deteriorated by a subsequent process by performing an implant process during a trench formation process. CONSTITUTION: A pad insulation layer is formed on a semiconductor substrate(11). A photoresist layer pattern is formed on the pad insulation layer. The pad insulation layer is etched by using the photoresist layer pattern as a mask to expose the semiconductor substrate. Impurities for controlling a threshold voltage are implanted into the exposed semiconductor substrate by using the photoresist layer pattern as a mask. A predetermined thickness of the semiconductor substrate is etched to form the trench(21) by using the photoresist layer pattern as a mask. The photoresist layer pattern is eliminated.
申请公布号 KR20030058644(A) 申请公布日期 2003.07.07
申请号 KR20010089168 申请日期 2001.12.31
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, CHEOL;PARK, HYEON HO
分类号 H01L21/762;(IPC1-7):H01L21/762 主分类号 H01L21/762
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