发明名称 |
METHOD FOR FABRICATING ISOLATION LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating an isolation layer of a semiconductor device is provided to prevent a defect in a trench and prevent a characteristic of the semiconductor device from being deteriorated by a subsequent process by performing an implant process during a trench formation process. CONSTITUTION: A pad insulation layer is formed on a semiconductor substrate(11). A photoresist layer pattern is formed on the pad insulation layer. The pad insulation layer is etched by using the photoresist layer pattern as a mask to expose the semiconductor substrate. Impurities for controlling a threshold voltage are implanted into the exposed semiconductor substrate by using the photoresist layer pattern as a mask. A predetermined thickness of the semiconductor substrate is etched to form the trench(21) by using the photoresist layer pattern as a mask. The photoresist layer pattern is eliminated.
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申请公布号 |
KR20030058644(A) |
申请公布日期 |
2003.07.07 |
申请号 |
KR20010089168 |
申请日期 |
2001.12.31 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, CHEOL;PARK, HYEON HO |
分类号 |
H01L21/762;(IPC1-7):H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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