发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of manufacturing a semiconductor device is provided to form selectively a silicide layer on only a gate electrode. CONSTITUTION: A gate insulation layer and a gate electrode is stacked on a semiconductor substrate(21). A source/drain region(26) is formed at both sides of the gate electrode. The first and second insulation layer are sequentially deposited on the substrate including the gate electrode(23). The second insulation layer is removed to leave only the source/drain region at both sides of the gate electrode. The first insulation layer is removed to protrude the upper part of the gate electrode. A silicide layer(29) is formed on the gate electrode.
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申请公布号 |
KR20030058824(A) |
申请公布日期 |
2003.07.07 |
申请号 |
KR20020000042 |
申请日期 |
2002.01.02 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, CHANG SEOP;PARK, BAN SEOK |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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