发明名称 CARRIER HEAD OF CMP APPARATUS
摘要 PURPOSE: A carrier head of a CMP(Chemical Mechanical Polishing) apparatus is provided to reduce largely a damage of a wafer by using a direct vacuum method to absorb the wafer. CONSTITUTION: A carrier head of a CMP apparatus includes a carrier housing(10), a body(20), a wafer support assembly(30), and a loading chamber(40). The carrier housing is driven by a carrier driving shaft. The body is installed and fixed at a center of a lower portion of the carrier housing. The wafer support assembly is arranged at a lower portion of the carrier housing in order to be vertically elevated to an outer surface of the body. A control chamber(33) is formed in the inside of the wafer support assembly. A wafer is absorbed or separated by controlling a pressure of the control chamber. The loading chamber is used for controlling a vertical position of the wafer supply assembly.
申请公布号 KR20030058501(A) 申请公布日期 2003.07.07
申请号 KR20010088957 申请日期 2001.12.31
申请人 SEMICONTECH CORP. 发明人 HAN, CHUNG HUI;HWANG, BYEONG RYEOL;KIM, SEON U
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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