发明名称 |
CARRIER HEAD OF CMP APPARATUS |
摘要 |
PURPOSE: A carrier head of a CMP(Chemical Mechanical Polishing) apparatus is provided to reduce largely a damage of a wafer by using a direct vacuum method to absorb the wafer. CONSTITUTION: A carrier head of a CMP apparatus includes a carrier housing(10), a body(20), a wafer support assembly(30), and a loading chamber(40). The carrier housing is driven by a carrier driving shaft. The body is installed and fixed at a center of a lower portion of the carrier housing. The wafer support assembly is arranged at a lower portion of the carrier housing in order to be vertically elevated to an outer surface of the body. A control chamber(33) is formed in the inside of the wafer support assembly. A wafer is absorbed or separated by controlling a pressure of the control chamber. The loading chamber is used for controlling a vertical position of the wafer supply assembly.
|
申请公布号 |
KR20030058501(A) |
申请公布日期 |
2003.07.07 |
申请号 |
KR20010088957 |
申请日期 |
2001.12.31 |
申请人 |
SEMICONTECH CORP. |
发明人 |
HAN, CHUNG HUI;HWANG, BYEONG RYEOL;KIM, SEON U |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|