发明名称 WAXLESS MOUNT POLISHING METHOD AND ITS APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a waxless mount polishing method of performing polishing corresponding to the thickness of a semiconductor wafer by using a template of a single thickness and its apparatus. <P>SOLUTION: When the thickness of the silicon wafer W is varied before polishing and varied to a target thickness after the polishing, a spacer S is inserted into and extracted from between a polishing head 12 and a plate fixing member 15 according to the wafer thicknesses having been varied to. Then the height of a template 14 is adjusted. Consequently, polishing corresponding to the thickness of the silicon wafer W can be performed by using the template 14 with the single thickness. <P>COPYRIGHT: (C)2003,JPO
申请公布号 JP2003188127(A) 申请公布日期 2003.07.04
申请号 JP20010388170 申请日期 2001.12.20
申请人 SUMITOMO MITSUBISHI SILICON CORP 发明人 SAITO TAKEO;UCHIDA TAKAHIRO;SATO TAIRA
分类号 B24B37/04;B24B37/30;B24B37/32;H01L21/304 主分类号 B24B37/04
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