发明名称 |
WAXLESS MOUNT POLISHING METHOD AND ITS APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a waxless mount polishing method of performing polishing corresponding to the thickness of a semiconductor wafer by using a template of a single thickness and its apparatus. <P>SOLUTION: When the thickness of the silicon wafer W is varied before polishing and varied to a target thickness after the polishing, a spacer S is inserted into and extracted from between a polishing head 12 and a plate fixing member 15 according to the wafer thicknesses having been varied to. Then the height of a template 14 is adjusted. Consequently, polishing corresponding to the thickness of the silicon wafer W can be performed by using the template 14 with the single thickness. <P>COPYRIGHT: (C)2003,JPO |
申请公布号 |
JP2003188127(A) |
申请公布日期 |
2003.07.04 |
申请号 |
JP20010388170 |
申请日期 |
2001.12.20 |
申请人 |
SUMITOMO MITSUBISHI SILICON CORP |
发明人 |
SAITO TAKEO;UCHIDA TAKAHIRO;SATO TAIRA |
分类号 |
B24B37/04;B24B37/30;B24B37/32;H01L21/304 |
主分类号 |
B24B37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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