发明名称 METHOD FOR FORMING CONTACT OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a contact of a semiconductor device is provided to be capable of restraining bridge between plugs by forming a landing plug using a line-type mask. CONSTITUTION: A conductive layer for forming a plug is formed on a substrate having gate lines. The gate lines are isolated by planarizing the conductive layer. The conductive layer is then selectively etched by using a mask having line-type opening region crossed vertically with the gate lines, thereby forming a landing plug(32a). The first interlayer dielectric is formed on the resultant structure. After forming the second interlayer dielectric, a bit line contact region is then formed by selectively etching the second interlayer dielectric.
申请公布号 KR20030056847(A) 申请公布日期 2003.07.04
申请号 KR20010087149 申请日期 2001.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, NAM JAE;YOO, HYEOK JUN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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