发明名称 |
METHOD FOR FORMING CONTACT OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a contact of a semiconductor device is provided to be capable of restraining bridge between plugs by forming a landing plug using a line-type mask. CONSTITUTION: A conductive layer for forming a plug is formed on a substrate having gate lines. The gate lines are isolated by planarizing the conductive layer. The conductive layer is then selectively etched by using a mask having line-type opening region crossed vertically with the gate lines, thereby forming a landing plug(32a). The first interlayer dielectric is formed on the resultant structure. After forming the second interlayer dielectric, a bit line contact region is then formed by selectively etching the second interlayer dielectric.
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申请公布号 |
KR20030056847(A) |
申请公布日期 |
2003.07.04 |
申请号 |
KR20010087149 |
申请日期 |
2001.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, NAM JAE;YOO, HYEOK JUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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