| 摘要 |
PURPOSE: A test method of a semiconductor memory device is provided to be capable of measuring exactly diverse measurement values by using a dummy cell having same condition to a cell. CONSTITUTION: In a test method of a semiconductor memory device, a dummy cell(305) is connected to dummy bit lines(DBL1,DBL2) by forming a contact in the dummy cell. The dummy bit lines(DBL1,DBL2) are connected to probe pads(308,310), respectively. After performing a desired test to the semiconductor memory device, the test result is measured by using the probe pads(308,310).
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