发明名称 METHOD FOR FORMING ISOLATION LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming an isolation layer of a semiconductor device is provided to be capable of improving the properties of moat and borderless contact and obtaining thermal stability of salicide. CONSTITUTION: A pad oxide layer is formed on a semiconductor substrate(11). A trench is formed in the substrate(11) by sequentially etching the pad oxide layer and the substrate. Sidewall oxidation processing is performed at the sidewalls of the trench. A nitride layer(17a) is filled into the trench. The surface of the resultant structure is planarized by polishing the nitride layer and the pad oxide layer.
申请公布号 KR20030056393(A) 申请公布日期 2003.07.04
申请号 KR20010086597 申请日期 2001.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HUH, SANG BEOM
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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