| 摘要 |
PURPOSE: A memory test device is provided to effectively reduce the cost for the test by using a test logic circuit and repair analysis circuit. CONSTITUTION: A memory test device(304) for testing a memory(302) electrically connected to a test board includes a test logic circuit(306), a recovery analysis circuit(308), a de-multiplexor(312) and a multiplexor(314). In the memory test device(304), the test logic circuit(306) performs the functional test of the memory(302) and the recovery analysis circuit(308) stores the address occurring the failure after the test and performs the recovery analysis. The memory test device(304) is mounted on the test board.
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