发明名称 PLASMA CHEMICAL DEPOSITION APPARATUS AND NITRIDE FILM- FORMING METHOD UTILIZING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a plasma chemical deposition apparatus that can form a high-quality nitride film by generating a plasma of high intensity, and to provide a nitride film-forming method utilizing the plasma chemical depositing apparatus. SOLUTION: The plasma chemical deposition apparatus is equipped with a process chamber comprising upper and lower chambers 40 and 42, a reaction gas discharge ring 44 for discharging a reaction gas, a susceptor 52 that has a heater at the inside and fixes a wafer 56 for rotating, a plasma correction ring 54, a vacuum pump 60, and a power supply. The wafer 5 is loaded onto the susceptor 52, a first reaction gas containing a nitrogen constituent is supplied for converting to a plasma state thus forming a base layer on the wafer. A second reaction gas containing a silicon constituent is supplied to the inside of the process chamber for forming a nitride film on the wafer. The supply of the first and second reaction gases is interrupted, power application is interrupted, and the wafer 56 is unloaded. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003188161(A) 申请公布日期 2003.07.04
申请号 JP20020311039 申请日期 2002.10.25
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 HAN JAE-JONG;KIN KEISHAKU;AHN BYUNG-HO;SHIN SEUNG MOK;KIM HWA-SIK;BOKU KOBAI
分类号 C23C16/513;C23C16/34;C23C16/44;C23C16/455;C23C16/50;C23C16/505;H01J37/32;H01L21/3065;H01L21/31;H01L21/318;(IPC1-7):H01L21/31;H01L21/306 主分类号 C23C16/513
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