发明名称 BEAM SEPARATOR AND REFLECTION ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a beam separator having a larger deflection angle and small aberration. SOLUTION: The beam separator comprises: a first pair of electrodes 15 forming a first region, in which a first electric field E<SB>1</SB>is perpendicular to a first axis A1; a pair of magnetic poles (not shown in the figure) forming a second region, in which a magnetic field B is perpendicular to each of the first axis A1 and the first electric field E<SB>1</SB>, and lying on the sample side of the first axis A1 respect to the first region; a third pair of electrodes 17 forming a third region, in which a second electric field E<SB>2</SB>is perpendicular to the first electric field E<SB>1</SB>, and lying on the sample side of the first axis A1 with respect to the second region; and a fourth pair of electrodes 18 forming a fourth region, in which a third electric field E<SB>3</SB>is perpendicular to each of a second axis A2 and the magnetic field B, and lying in the incident direction of an electron beam to a sample of the second axis A2 toward the second region with respect to the second axis A2 perpendicular to each of the first axis A1 and the magnetic field B. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003187730(A) 申请公布日期 2003.07.04
申请号 JP20010380330 申请日期 2001.12.13
申请人 JEOL LTD 发明人 TSUNO KATSUSHIGE;IIDA NOBUO
分类号 G21K1/08;G21K5/04;H01J37/05;H01J37/29;(IPC1-7):H01J37/05 主分类号 G21K1/08
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