发明名称 TEST EQUIPMENT OF OPTICAL DISK AND INSPECTION METHOD OF OPTICAL DISK
摘要 PROBLEM TO BE SOLVED: To provide a test equipment of an optical disk and an examination method of the optical disk, by which the consistency between a true value and a measured value can be obtained with sufficient reproducibility over the entire specification range and can inspect an optical disk as the object of inspection in properties closer to those of a prototype. SOLUTION: An optical disk 33 as the object of inspection is reproduced by using a gain correction factor a<SB>j</SB>and an offset correction factor b<SB>j</SB>, in each n+1 section as parameters for calibration. In reproducing, a measured value of a reproduced signal actually measured in each the section (section number j), sectioned by the reproducing part of at least three points is expressed as X, and the measured value X is applied to a correlation equation. A measurement means 7 are then calibrated, based on a calibration value Y which fills the following equation. The calibration value Y= (gain correction factor a<SB>j</SB>) + (measured value X) + (offset correction factor b<SB>j</SB>). Then an optical disk 33 as the object of inspection is inspected. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003187440(A) 申请公布日期 2003.07.04
申请号 JP20010380482 申请日期 2001.12.13
申请人 SONY DISC TECHNOLOGY INC 发明人 KIKUNO EIJIRO
分类号 G11B7/004;G11B7/26;(IPC1-7):G11B7/004 主分类号 G11B7/004
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