| 摘要 |
PURPOSE: A double data rate(DDR) semiconductor memory device provided with a single data rate(SDR) memory function and a method for testing the same are provided to reduce the test time by using the test device for use in testing one data per one clock. CONSTITUTION: A double data rate(DDR) semiconductor memory device provided with a single data rate(SDR) memory function includes a write driver(10), a data line sense amplifier(20), a test mode line(70), a compression device(60), an input data multiplexing device(30), a data output multiplexing device(40) and a test mode decoder(50). The DDR semiconductor memory device further includes a global data line provided with an even global data line and an odd global data line. In the double data rate(DDR) semiconductor memory device, the data input multiplexing device(30) inputs the data to the global data line in response to the input of the test mode signal. And, the data output multiplexing device(40) outputs the data of the global data line in response to the input of the test mode signal.
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