发明名称 TRANSFER ROBOT AND INSPECTION METHOD FOR THIN SUBSTRATE
摘要 A transfer robot ( 5 ) for thin substrate capable of efficiently detecting the stored state of thin substrates and an inspection method for thin substrate capable of accurately detecting the stored state of thin substrates; the robot ( 5 ), comprising an inspection camera ( 1 ) for detecting the stored state of the thin substrates ( 3 ) in a storage cassette ( 2 ), wherein the plurality of thin substrates ( 3 ) stored in the storage cassette ( 2 ) are carried out from the storage cassette ( 2 ) by the robot.
申请公布号 KR20030057564(A) 申请公布日期 2003.07.04
申请号 KR20037007234 申请日期 2003.05.29
申请人 发明人
分类号 B25J13/08;H01L21/68;B25J9/04;B25J18/04;B25J19/02;B25J19/04;B65G49/06;B65G49/07;H01L21/00;H01L21/677 主分类号 B25J13/08
代理机构 代理人
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