发明名称 EXPOSURE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an exposure device which attains alignment with high precision. SOLUTION: When a base plate 4 is turned byθ°and -θ°before alignment, the relative coordinates of a mask mark 30 and a base plate mark 40 are obtained. From the relative coordinates, the coordinate of the mask mark 30 against the coordinate axis 90 of the exposure device is obtained. Based upon the coordinate, the alignment is carried out. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003186209(A) 申请公布日期 2003.07.03
申请号 JP20010382887 申请日期 2001.12.17
申请人 ADTEC ENGINEENG CO LTD 发明人 HASEGAWA KOJI
分类号 G03F9/00;(IPC1-7):G03F9/00 主分类号 G03F9/00
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