| 摘要 |
PROBLEM TO BE SOLVED: To provide an analyzer by which a sample can be analyzed in a short time and efficiently with a simple and small constitution and by which a two-dimensional and multiply dotted sample can be analyzed. SOLUTION: In the analyzer A1, the sample S is analyzed by using a sensor chip 9 which has a sensor face 9A coming into contact with the sample S and which can generate a surface plasmon resonance phenomenon by the irradiation of light at the sensor face 9A. The analyzer A1 is constituted so as to be provided with a surface emitting laser light source 1 which has a plasmon laser light emitting element 11 and by which the light is irradiated at the sensor face 9A, a measuring means 2 which measures an intensity of reflected light from the sensor face 9A due to the incidence of the irradiation light on the sensor face 9A, and an analytical means 3 which analyzes the sample by finding an absorption state of the irradiation light due to the surface plasmon resonance phenomenon on the basis of the intensity of the reflected light. COPYRIGHT: (C)2003,JPO
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