发明名称 Wafer drying apparatus
摘要 An apparatus for drying a semiconductor substrate includes a chamber having a processing bath and a cover, a liquid flow system for supplying a liquid flow into the processing bath so as to clean the substrate and for draining a liquid from the processing bath, a gas distributor for spraying a gas for drying the substrate, and decompression means for exhausting air in the chamber.
申请公布号 US2003121173(A1) 申请公布日期 2003.07.03
申请号 US20020183813 申请日期 2002.06.26
申请人 DNS KOREA CO., LTD 发明人 BAE JEONG YONG;YOON CHANG-RO;PARK PYENG-JAE
分类号 H01L21/304;H01L21/00;(IPC1-7):F26B19/00;F26B25/06;F26B9/00;F26B13/00;F26B13/06 主分类号 H01L21/304
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