| 摘要 |
PROBLEM TO BE SOLVED: To allow use in both a per-pin system and a shared system. SOLUTION: The present invention provides an improved IC tester for testing a tested object. This tester has a memory part for storing a test program for testing the tested object, and a control means for conducting control by the per-pin system and the shared system by the test program stored in the memory part, based on the per-pin system and the shared system. COPYRIGHT: (C)2003,JPO
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