发明名称 ELECTRODE INSPECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide stable contact of a probe with an electrode. SOLUTION: A head part 2 is movably mounted on a column part 1 by means of linear guides 3 and a ball screw 5, and an adjustment plate 8 is provided on an end plate 7 of the head part 2. A support plate 12 is mounted on the adjustment plate 8 by means of linear guides 11. The self weight of the plate 12 is cancelled by a spring and contact pressure is applied thereto by a low-slide resistance cylinder 13. An MFP 50 provided on an end part of the plate 12 descends together with the head part 2 by controlling drive of a servomotor 4 and makes contact with a wiring pattern P. Surface fluctuations of an inspection object W are absorbed by the plate 12 escaping therefrom and a contact pressure of the probe 51 is made constant by the cylinder 13. This causes the probe 51 to make stable contact with the electrode. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003185704(A) 申请公布日期 2003.07.03
申请号 JP20010383021 申请日期 2001.12.17
申请人 SEIKO EPSON CORP 发明人 SASAKI TSUTOMU
分类号 G01R31/26;G01R1/06;G01R31/28;H01L21/66;(IPC1-7):G01R31/28 主分类号 G01R31/26
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