发明名称 ELECTRICALLY PROGRAMMED MOS TRANSISTOR SOURCE/DRAIN SERIES RESISTANCE
摘要 High-speed MOS transistors (32) are provided by forming a conductive layer (24) embedded in transistor gate sidewall spacers (27). The embedded conductive layer (24) is electrically insulated from the gate electrode (18) and the source/drain regions (28) of the transistor (32). The embedded conductive layer (24) is positioned over the source/drain extensions (30) and causes charge to accumulate in the source/drain extensions (30) lowering the series resistance of the source/drain regions (28).
申请公布号 WO03054969(A1) 申请公布日期 2003.07.03
申请号 WO2002US41330 申请日期 2002.12.19
申请人 ADVANCED MICRO DEVICES, INC. 发明人 BULLER, JAMES, F.;XIANG, QI;WRISTERS, DERICK, J.
分类号 H01L21/8238;H01L21/336;H01L27/092;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/8238
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