发明名称 PROBE CARD FOR ELECTRICAL INSPECTION
摘要 PROBLEM TO BE SOLVED: To provide a probe card for an electrical inspection which can reduce costs such as production costs, maintenance costs or the like. SOLUTION: A probe pin 11 is formed integrally as a pin of a solid structure, and an elastic member 17 is interposed and mounted between a receiver pin 12 and an opening 3a on one side of a pin housing hole 3. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003185677(A) 申请公布日期 2003.07.03
申请号 JP20010387564 申请日期 2001.12.20
申请人 MITSUI MINING & SMELTING CO LTD 发明人 TAKEMURA TATSUHIKO;HASEGAWA KOJI
分类号 G01R31/26;G01R1/067;G01R1/073;G01R31/28;(IPC1-7):G01R1/073 主分类号 G01R31/26
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