发明名称 |
PROBE CARD FOR ELECTRICAL INSPECTION |
摘要 |
PROBLEM TO BE SOLVED: To provide a probe card for an electrical inspection which can reduce costs such as production costs, maintenance costs or the like. SOLUTION: A probe pin 11 is formed integrally as a pin of a solid structure, and an elastic member 17 is interposed and mounted between a receiver pin 12 and an opening 3a on one side of a pin housing hole 3. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003185677(A) |
申请公布日期 |
2003.07.03 |
申请号 |
JP20010387564 |
申请日期 |
2001.12.20 |
申请人 |
MITSUI MINING & SMELTING CO LTD |
发明人 |
TAKEMURA TATSUHIKO;HASEGAWA KOJI |
分类号 |
G01R31/26;G01R1/067;G01R1/073;G01R31/28;(IPC1-7):G01R1/073 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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