发明名称 Method for forming metal lines of semiconductor device
摘要 After first metal lines and a first inter-metal dielectric are formed on a semiconductor substrate, top surfaces thereof are planarized to construct a flat plane. Then, second metal lines each being vertically aligned with a corresponding first metal line are formed on the flat plane, so that integral metal lines of a high aspect ratio are constructed. Gaps formed by the second metal lines are filled with a second inter-metal dielectric, which is joined with the first inter-metal dielectric to construct an integral inter-metal dielectric.
申请公布号 US2003124860(A1) 申请公布日期 2003.07.03
申请号 US20020327858 申请日期 2002.12.26
申请人 LEE JAE SUK;LEE YOUNG SUNG 发明人 LEE JAE SUK;LEE YOUNG SUNG
分类号 B24B37/00;H01L21/28;H01L21/304;H01L21/3205;H01L21/768;H01L23/52;H01L23/532;(IPC1-7):H01L21/320 主分类号 B24B37/00
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