发明名称 MEASUREMENT METHOD FOR THICKNESS OF LAMINATED FILM AND MEASUREMENT DEVICE FOR THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a measurement method for a thickness of laminated film and a measurement device for the same in which the operation interruption time of T-die gets remarkably reduced as well as the loss of the laminated film gets minimized and, accordingly, the productivity and economy are improved. <P>SOLUTION: A non-contact thickness detecting sensor is reciprocated at a constant speed in the range wider than the width of the laminated film in the width direction of the same to be transferred. By this movement, the sensor traverses zigzag in the oblique direction of the laminated film and scans and measures the thickness of the laminated film in the width direction. <P>COPYRIGHT: (C)2003,JPO</p>
申请公布号 JP2003181905(A) 申请公布日期 2003.07.03
申请号 JP20010388046 申请日期 2001.12.20
申请人 JOHOKU SEIKOSHO:KK 发明人 MAEJIMA MOKICHI;MAEJIMA YASUHIRO
分类号 G01B21/02;B29C47/08;B29C47/14;B29C47/92;B29L7/00;(IPC1-7):B29C47/92 主分类号 G01B21/02
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